Product information
Tescan MIRA XR™ accelerates data acquisition and processing with fully integrated Dual Essence™ EDS, Wide Field Optics™, and In-Flight™ Automation. It reduces time to ultra-high-resolution SEM data by at least 30% compared to conventional systems.
Automated alignment and calibration routines ensure repeatable results with minimal user input, optimizing efficiency for both routine and advanced research applications.
- Ultra-high resolution capabilities by MIRA™ optimized BrightBeam™ technology
- Accelerate time to data with In-Flight Beam Tracing™ and In-Flight Automatics for fast and repeatable imaging and analytical performance, even for the SEM novice users
- Effortlessly navigate samples and identify regions of interest with Wide Field Optics™, enabling magnification from 1x
- Achieve up to twice faster EDS data acquisition with reduced shading enabled by Dual Essence™ EDS
- Analyze even higly charging, beam sensitive, or outgassing samples efficiently and without any interuptions with MultiVac™ and Auto LowVac Aperture
How TESCAN MIRA XR™Enhances SEM Solutions
Reproducible Nanometer-Scale Imaging
Achieve consistent, ultra-high-resolution results across users and sessions with BrightBeam™ technology and In-Flight Beam Tracing™, ensuring stable beam conditions and repeatable imaging quality.
Confident Imaging of Challenging Samples
Capture reliable images of charging, porous, or beam-sensitive materials in MultiVac™ low-vacuum mode. No coating is required.
Fast, Accurate Chemical Mapping
Double your EDS throughput with Dual Essence™ EDS, providing precise multi-element maps and reduced shading for efficient compositional analysis.
Streamlined and Automated Workflows
Simplify complex imaging tasks with VisualCoder™ automation, allowing intuitive drag-and-drop workflow creation that reduces operator time by up to 80%.
Effortless Navigation Across Scales
Move seamlessly from large-area overviews to nanoscale details with Wide Field Optics™, accelerating orientation and reducing time-to-data.
EBSD-Ready Crystallographic Analysis
Combine large-area and nanoscale EBSD mapping in one workflow, supported by Tescan MIRA XR™’s stable beam conditions and wide analytical chamber for comprehensive crystallographic studies
Tescan Imaging Software
Tescan Essence™
Unified Control for SEM Imaging and Microanalysis
Tescan Essence™ brings imaging, navigation and analytical tools into one environment, supporting clear, consistent SEM workflows for materials scientists and inspection teams. Its streamlined layout and automation features help users move efficiently from first navigation to final verification.
- Access spectra, elemental maps, and imaging data within a single integrated Essence™ SW control interface
- Maintain consistent beam performance with In-Flight Beam Tracing™
- Navigate confidently using the real-time Essence™ 3D Collision Model to protect detectors and sample
