Since 1959, Herzog has led the world in laboratory automation and sample preparation—trusted across industries worldwide.
The dedicated Herzog USA office, now with a showroom and expert support team, brings German engineering and world-class expertise directly to American laboratories.
From sample preparation to fully integrated intelligent automation systems, our technology delivers unmatched precision, performance, and reliability.
Engineered for the future, our solutions support digital transformation and sustainability to meet the highest demands of American laboratories.
X-ray computed tomography (CT) X-ray CT can analyze the internal structures of materials and objects non-destructively at micron to submicron resolution. Rigaku’s CT scanners are easy to use and widely implemented in research facilities and failure analysis laboratories.
Tescan VEGA compact Compact analytical SEM for fast, high-quality imaging and EDS in materials science, QA/QC, and education. Tescan VEGA Compact delivers high-resolution imaging and integrated EDS in a simplified, space-efficient system. With intuitive Tescan Essence™ software and a large chamber that accommodates industrial-scale samples, it’s the ideal choice for
TUBE-ABOVE SIMULTANEOUS WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER High-throughput elemental analysis of solids, powders and alloys For over 40 years, the Rigaku Simultix simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system has been widely used as an elemental analytical tool for process control in industries that require high throughput and precision,
TUBE-ABOVE SEQUENTIAL WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER Elemental analysis of solids, liquids, powders, alloys and thin films As a tube-above sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in
BENCHTOP POWDER X-RAY DIFFRACTION (XRD) INSTRUMENT Qualitative and quantitative phase analysis of poly-crystalline materials Benchtop X-ray diffractometer for phase analysis New sixth generation MiniFlex benchtop X-ray diffractometer is a multipurpose powder diffraction analytical instrument that can determine: crystalline phase identification (phase ID) and quantification, percent (%) crystallinity, crystallite size and
MULTIPURPOSE X-RAY DIFFRACTION SYSTEM WITH BUILT-IN INTELLIGENT GUIDANCE Powder diffraction, thin film diffraction, SAXS, pole figure, residual stress and non-ambient experiments The SmartLab® SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original
X-ray computed tomography (CT) X-ray CT can analyze the internal structures of materials and objects non-destructively at micron to submicron resolution. Rigaku’s CT scanners are easy to use and widely implemented in research facilities and failure analysis laboratories.
Tescan VEGA compact Compact analytical SEM for fast, high-quality imaging and EDS in materials science, QA/QC, and education. Tescan VEGA Compact delivers high-resolution imaging and integrated EDS in a simplified, space-efficient system. With intuitive Tescan Essence™ software and a large chamber that accommodates industrial-scale samples, it’s the ideal choice for
TUBE-ABOVE SIMULTANEOUS WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER High-throughput elemental analysis of solids, powders and alloys For over 40 years, the Rigaku Simultix simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system has been widely used as an elemental analytical tool for process control in industries that require high throughput and precision,
TUBE-ABOVE SEQUENTIAL WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER Elemental analysis of solids, liquids, powders, alloys and thin films As a tube-above sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in
BENCHTOP POWDER X-RAY DIFFRACTION (XRD) INSTRUMENT Qualitative and quantitative phase analysis of poly-crystalline materials Benchtop X-ray diffractometer for phase analysis New sixth generation MiniFlex benchtop X-ray diffractometer is a multipurpose powder diffraction analytical instrument that can determine: crystalline phase identification (phase ID) and quantification, percent (%) crystallinity, crystallite size and
MULTIPURPOSE X-RAY DIFFRACTION SYSTEM WITH BUILT-IN INTELLIGENT GUIDANCE Powder diffraction, thin film diffraction, SAXS, pole figure, residual stress and non-ambient experiments The SmartLab® SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original
X-ray computed tomography (CT) X-ray CT can analyze the internal structures of materials and objects non-destructively at micron to submicron resolution. Rigaku’s CT scanners are easy to use and widely implemented in research facilities and failure analysis laboratories.
Tescan VEGA compact Compact analytical SEM for fast, high-quality imaging and EDS in materials science, QA/QC, and education. Tescan VEGA Compact delivers high-resolution imaging and integrated EDS in a simplified, space-efficient system. With intuitive Tescan Essence™ software and a large chamber that accommodates industrial-scale samples, it’s the ideal choice for
TUBE-ABOVE SIMULTANEOUS WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER High-throughput elemental analysis of solids, powders and alloys For over 40 years, the Rigaku Simultix simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system has been widely used as an elemental analytical tool for process control in industries that require high throughput and precision,
TUBE-ABOVE SEQUENTIAL WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER Elemental analysis of solids, liquids, powders, alloys and thin films As a tube-above sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a
BENCHTOP POWDER X-RAY DIFFRACTION (XRD) INSTRUMENT Qualitative and quantitative phase analysis of poly-crystalline materials Benchtop X-ray diffractometer for phase analysis New sixth generation MiniFlex benchtop X-ray diffractometer is a multipurpose powder diffraction analytical instrument that can determine: crystalline phase identification (phase ID) and quantification, percent (%) crystallinity, crystallite size and
MULTIPURPOSE X-RAY DIFFRACTION SYSTEM WITH BUILT-IN INTELLIGENT GUIDANCE Powder diffraction, thin film diffraction, SAXS, pole figure, residual stress and non-ambient experiments The SmartLab® SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab