
Rigaku Corporation
AutoMATE II
Micro-Area X-ray Residual Stress Measurement System Highly accurate micro-area residual stress with both iso- and side-inclination methods Residual stress may be created during the…
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PRODUCT CATEGORY
Characterise phases and crystal structures using diffraction and scattering.
7 products in this category

Rigaku Corporation
Micro-Area X-ray Residual Stress Measurement System Highly accurate micro-area residual stress with both iso- and side-inclination methods Residual stress may be created during the…
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Rigaku Corporation
Benchtop Small Angle X-ray Scattering (SAXS) and USAXS Instrument Non-destructive measurement of particle size and size distribution Rigaku NANOPIX mini is the world’s first…
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Rigaku Corporation
Wide-angle X-ray scattering (WAXS) system Breakthrough speed and versatility for polymer structure analysis Next-generation WAXS system equipped with a high-brilliance X-ray source Structural information…
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Rigaku Corporation
Benchtop powder X-ray diffraction (XRD) instrument Qualitative and quantitative phase analysis of polycrystalline materials The MiniFlex benchtop X-ray diffractometer is a multipurpose powder diffraction…
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Rigaku Corporation
Automated Multipurpose X‑ray Diffractometer (XRD) With Guidance Software Powder diffraction, thin film metrology, SAXS, in-plane scattering, operando measurements Rigaku SmartLab is the newest and…
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Rigaku Corporation
Compact X-ray Diffractometer Advanced quality control system In a move to bring lab-quality performance to the manufacturing floor, Rigaku introduces the MiniFlex XpC, a…
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Rigaku Corporation
MULTIPURPOSE X-RAY DIFFRACTION SYSTEM WITH BUILT-IN INTELLIGENT GUIDANCE Powder diffraction, thin film diffraction, SAXS, pole figure, residual stress and non-ambient experiments The SmartLab® SE…
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Characterise phases and crystal structures using diffraction and scattering. The current product range is listed on this page; open a product for its available details and images.
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