Trace materials
Define the size, condition and information required from trace samples before selecting an examination method.
YOUR APPLICATION, IN FOCUS
Start with what you need to measure.
Explore microscopy, material characterisation and imaging tools for forensic examination and research workflows.
Microscopy and imaging
Investigate morphology and internal features where the selected system and specimen permit.
Evidence workflow
Review sample preparation, examination sequence and reporting requirements with your laboratory team.
EXPLORE THE RANGE
Forensics equipment
31 catalogue products
Rigaku Corporation
XtaLAB Synergy-ED
Fully Integrated Electron Diffractometer A system any X-ray crystallographer will find intuitive to operate XtaLAB Synergy-ED is a new and fully integrated electron diffractometer,…
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Rigaku Corporation
CT Lab GX
Stationary sample, high-speed X-ray CT scanner Ex-vivo and ultrafast in-situ compatible Rigaku CT Lab GX is a micro-CT (computed tomography) scanner. The sample stays…
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Rigaku Corporation
nano3DX
True submicron CT scanner with contrast-enhancing X-ray anode 3D X-ray microscope Rigaku nano3DX is a true submicron resolution CT (computed tomography) scanner. The parallel…
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Rigaku Corporation
CT Lab HX
Versatile X-ray Micro CT Scanner High-performance benchtop Rigaku CT Lab HX is a benchtop micro CT (computed tomography) scanner. The adjustable SOD (source-to-object distance)…
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TESCAN
Tescan Spectral CT
Tescan Spectral CT is designed for laboratories that need non-destructive 3D elemental insight alongside structural imaging. As an add-on to the Tescan UniTOM® XL,…
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TESCAN
Tescan UniTOM® XL
Tescan UniTOM® XL, and its smaller version, CoreTOM® are designed for research environments where temporal resolution, imaging flexibility, and experimental throughput matter. A high-power…
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TESCAN
Tescan UniTOM® HR 2
In-Situ Continuity for Dynamic-to-Detail discovery Tescan UniTOM® HR 2 is a dynamic micro-CT platform designed around one core concept: In-Situ Continuity. You capture fast…
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TESCAN
Tescan SOLARIS X™ 2
Tescan SOLARIS X™ 2 is built for laboratories where package-level failure analysis, large-area cross-sectioning, and Ga-free sample preparation demand both speed and precision. Powered…
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TESCAN
Tescan Solaris™ 2
Tescan SOLARIS™ 2 is designed for semiconductor laboratories where precision, reproducibility, and throughput are essential. With fully automated TEM lamella preparation powered by TEM…
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TESCAN
Tescan AMBER X™ 2 (PFIB)
Tescan AMBER X™ 2 is an advanced plasma FIB-SEM that combines the Mistral™ Plasma FIB column with the field-free BrightBeam™ UHR SEM to deliver…
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TESCAN
Tescan AMBER™ 2
Advanced FIB-SEM for Automated Sample Preparation, Nanoscale Characterization and Nanoprototyping Tescan AMBER™ 2 is a fully automated Ga⁺ FIB-SEM designed for routine TEM sample…
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TESCAN
Tescan MAGNA™
UHR SEM with TriLens™ immersion optics for the ultimate characterization of nanomaterials Tescan MAGNA™ is designed for high-performance surface characterization of nanomaterials. Its Triglav™…
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TESCAN
Tescan CLARA™
Ultra-High-Resolution SEM That Reveals More Information from Every Scan Extract more information from challenging materials at low landing energies. CLARA™ combines field‑free ultra‑high‑resolution SEM…
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TESCAN
Tescan MIRA XR™
Tescan MIRA XR™ accelerates data acquisition and processing with fully integrated Dual Essence™ EDS, Wide Field Optics™, and In-Flight™ Automation. It reduces time to…
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TESCAN
Tescan MIRA™ SEM
Tescan MIRA™ SEM pairs a FEG Schottky source with integrated SEM imaging and live elemental analysis in a single Essence™ software window, simplifying the…
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TESCAN
Tescan VEGA™ SEM
Tescan VEGA™ Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and elemental composition analysis in a single window of Tescan’s…
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Rigaku Corporation
NEX CG II Series
Next-Generation Cartesian Geometry Energy Dispersive X‑ray Fluorescence Spectrometers Enhanced elemental analysis for industrial quality control to advanced research applications NEX CG II Series are…
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Rigaku Corporation
NEX DE Series
High-performance Direct Excitation EDXRF Spectrometers Powerful, non-destructive qualitative and quantitative elemental analysis The Rigaku NEX DE Series are high-performance, direct excitation EDXRF spectrometers that…
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Rigaku Corporation
NEX QC II Series
EDXRF for Everyday Quality Control Fast, non-destructive elemental testing made simple The NEX QC II Series simplifies routine quality control and elemental testing. These…
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Rigaku Corporation
ZSX Primus IV
Tube-above sequential wavelength dispersive X-ray fluorescence spectrometer Elemental analysis of solids, liquids, powders, alloys and thin films As a tube-above sequential wavelength dispersive X-ray…
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Rigaku Corporation
ZSX Primus III NEXT
Tube-above sequential wavelength dispersive X-ray fluorescence spectrometer for industrial applications Elemental analysis of solid samples Rigaku ZSX Primus III NEXT delivers rapid elemental industrial…
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Rigaku Corporation
Supermini200
High-Power Benchtop Sequential WDXRF Spectrometer Elemental analysis of solids, liquids, powders, alloys and thin films Compared to competing XRF systems, the Rigaku Supermini200 offers…
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Rigaku Corporation
ZSX Primus400
Sequential Wavelength Dispersive XRF Spectrometer for Large Samples Elemental analysis of solids, liquids, powders, alloys and thin films Rigaku’s unique ZSX Primus 400 sequential…
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Rigaku Corporation
XtaLAB mini II
Benchtop Single Crystal X-ray Diffractometer Single crystal X-ray diffraction on your benchtop The perfect addition to any synthetic chemistry laboratory, the XtaLAB mini II…
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