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Food & Agriculture

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YOUR APPLICATION, IN FOCUS

Start with what you need to measure.

Explore analytical tools and laboratory preparation for soils, agricultural minerals and food-related material studies.

Soils and minerals

Define the elemental or mineral information required for soil and agricultural-material investigations.

Sample consistency

Consider moisture, particle size and representative preparation when designing an analytical workflow.

Method suitability

Review the sample matrix, target measurements and relevant method before selecting equipment for a food-related application.

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Food & Agriculture equipment

59 catalogue products

CT Lab GX

Rigaku Corporation

CT Lab GX

Stationary sample, high-speed X-ray CT scanner Ex-vivo and ultrafast in-situ compatible Rigaku CT Lab GX is a micro-CT (computed tomography) scanner. The sample stays…

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nano3DX

Rigaku Corporation

nano3DX

True submicron CT scanner with contrast-enhancing X-ray anode 3D X-ray microscope Rigaku nano3DX is a true submicron resolution CT (computed tomography) scanner. The parallel…

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CT Lab HX

Rigaku Corporation

CT Lab HX

Versatile X-ray Micro CT Scanner High-performance benchtop Rigaku CT Lab HX is a benchtop micro CT (computed tomography) scanner. The adjustable SOD (source-to-object distance)…

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Tescan Spectral CT

TESCAN

Tescan Spectral CT

Tescan Spectral CT is designed for laboratories that need non-destructive 3D elemental insight alongside structural imaging. As an add-on to the Tescan UniTOM® XL,…

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Tescan UniTOM® XL

TESCAN

Tescan UniTOM® XL

Tescan UniTOM® XL, and its smaller version, CoreTOM® are designed for research environments where temporal resolution, imaging flexibility, and experimental throughput matter. A high-power…

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Tescan UniTOM® HR 2

TESCAN

Tescan UniTOM® HR 2

In-Situ Continuity for Dynamic-to-Detail discovery Tescan UniTOM® HR 2 is a dynamic micro-CT platform designed around one core concept: In-Situ Continuity. You capture fast…

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Tescan SOLARIS X™ 2

TESCAN

Tescan SOLARIS X™ 2

Tescan SOLARIS X™ 2 is built for laboratories where package-level failure analysis, large-area cross-sectioning, and Ga-free sample preparation demand both speed and precision. Powered…

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Tescan Solaris™ 2

TESCAN

Tescan Solaris™ 2

Tescan SOLARIS™ 2 is designed for semiconductor laboratories where precision, reproducibility, and throughput are essential. With fully automated TEM lamella preparation powered by TEM…

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Tescan AMBER X™ 2 (PFIB)

TESCAN

Tescan AMBER X™ 2 (PFIB)

Tescan AMBER X™ 2 is an advanced plasma FIB-SEM that combines the Mistral™ Plasma FIB column with the field-free BrightBeam™ UHR SEM to deliver…

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Tescan AMBER™ 2

TESCAN

Tescan AMBER™ 2

Advanced FIB-SEM for Automated Sample Preparation, Nanoscale Characterization and Nanoprototyping Tescan AMBER™ 2 is a fully automated Ga⁺ FIB-SEM designed for routine TEM sample…

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Tescan MAGNA™

TESCAN

Tescan MAGNA™

UHR SEM with TriLens™ immersion optics for the ultimate characterization of nanomaterials Tescan MAGNA™ is designed for high-performance surface characterization of nanomaterials. Its Triglav™…

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Tescan CLARA™

TESCAN

Tescan CLARA™

Ultra-High-Resolution SEM That Reveals More Information from Every Scan Extract more information from challenging materials at low landing energies. CLARA™ combines field‑free ultra‑high‑resolution SEM…

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Tescan MIRA XR™

TESCAN

Tescan MIRA XR™

Tescan MIRA XR™ accelerates data acquisition and processing with fully integrated Dual Essence™ EDS, Wide Field Optics™, and In-Flight™ Automation. It reduces time to…

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Tescan MIRA™  SEM

TESCAN

Tescan MIRA™ SEM

Tescan MIRA™ SEM pairs a FEG Schottky source with integrated SEM imaging and live elemental analysis in a single Essence™ software window, simplifying the…

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Tescan VEGA™ SEM

TESCAN

Tescan VEGA™ SEM

Tescan VEGA™ Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and elemental composition analysis in a single window of Tescan’s…

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NEX CG II Series

Rigaku Corporation

NEX CG II Series

Next-Generation Cartesian Geometry Energy Dispersive X‑ray Fluorescence Spectrometers Enhanced elemental analysis for industrial quality control to advanced research applications NEX CG II Series are…

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NEX DE Series

Rigaku Corporation

NEX DE Series

High-performance Direct Excitation EDXRF Spectrometers Powerful, non-destructive qualitative and quantitative elemental analysis The Rigaku NEX DE Series are high-performance, direct excitation EDXRF spectrometers that…

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NEX QC II Series

Rigaku Corporation

NEX QC II Series

EDXRF for Everyday Quality Control Fast, non-destructive elemental testing made simple The NEX QC II Series simplifies routine quality control and elemental testing. These…

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Simultix15

Rigaku Corporation

Simultix 15

The Rigaku Simultix 15 is a simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for high-throughput elemental analysis of prepared solids, powders and alloys. It…

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ZSX Primus IV

Rigaku Corporation

ZSX Primus IV

The Rigaku ZSX Primus IV is a tube-above sequential WDXRF spectrometer for elemental analysis of powders, solids, alloys, liquids and thin films. Its tube-above…

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ZSX Primus III NEXT

Rigaku Corporation

ZSX Primus III NEXT

Tube-above sequential wavelength dispersive X-ray fluorescence spectrometer for industrial applications Elemental analysis of solid samples Rigaku ZSX Primus III NEXT delivers rapid elemental industrial…

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Supermini200

Rigaku Corporation

Supermini200

High-Power Benchtop Sequential WDXRF Spectrometer Elemental analysis of solids, liquids, powders, alloys and thin films Compared to competing XRF systems, the Rigaku Supermini200 offers…

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ZSX Primus400

Rigaku Corporation

ZSX Primus400

Sequential Wavelength Dispersive XRF Spectrometer for Large Samples Elemental analysis of solids, liquids, powders, alloys and thin films Rigaku’s unique ZSX Primus 400 sequential…

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XtaLAB mini II

Rigaku Corporation

XtaLAB mini II

Benchtop Single Crystal X-ray Diffractometer Single crystal X-ray diffraction on your benchtop The perfect addition to any synthetic chemistry laboratory, the XtaLAB mini II…

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