X-ray computed tomography (CT)
X-ray computed tomography (CT) X-ray CT can analyze the internal structures of materials and objects non-destructively at micron to submicron resolution. Rigaku’s CT scanners are easy to use and widely implemented in research facilities and failure analysis laboratories.
Simultix 15
TUBE-ABOVE SIMULTANEOUS WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER High-throughput elemental analysis of solids, powders and alloys For over 40 years, the Rigaku Simultix simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system has been widely used as an elemental analytical tool for process control in industries that require high throughput and precision, such as steel and cement. […]
ZSX Primus IV
TUBE-ABOVE SEQUENTIAL WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER Elemental analysis of solids, liquids, powders, alloys and thin films As a tube-above sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types […]