Since 2011, Rajpoot Links (Private) Limited has been delivering analytical, industrial, and laboratory systems to Pakistan’s cement, steel, mining, and research sectors. We work in close alignment with globally recognized manufacturers to provide complete solutions — from equipment supply and installation to commissioning and long-term technical support.
With a nationwide footprint of 600+ installations, our strength lies in application understanding, OEM-trained service capability, and dependable after-sales support — enabling our clients to operate with confidence, accuracy, and continuity.
High-resolution micro-CT for sub-micron imaging and dynamic 4D in-situ testing Tescan UniTOM HR gives you sub-600 nm spatial resolution and high-speed, time-resolved 3D imaging in a single system. Visualize structural evolution under load, temperature, or environmental conditions in real time across a wide range of sample sizes. Key benefits High-fidelity
X-ray computed tomography (CT) X-ray CT can analyze the internal structures of materials and objects non-destructively at micron to submicron resolution. Rigaku’s CT scanners are easy to use and widely implemented in research facilities and failure analysis laboratories.
Tescan VEGA compact Compact analytical SEM for fast, high-quality imaging and EDS in materials science, QA/QC, and education. Tescan VEGA Compact delivers high-resolution imaging and integrated EDS in a simplified, space-efficient system. With intuitive Tescan Essence™ software and a large chamber that accommodates industrial-scale samples, it’s the ideal choice for
TUBE-ABOVE SIMULTANEOUS WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER High-throughput elemental analysis of solids, powders and alloys For over 40 years, the Rigaku Simultix simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system has been widely used as an elemental analytical tool for process control in industries that require high throughput and precision,
TUBE-ABOVE SEQUENTIAL WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER Elemental analysis of solids, liquids, powders, alloys and thin films As a tube-above sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in
BENCHTOP POWDER X-RAY DIFFRACTION (XRD) INSTRUMENT Qualitative and quantitative phase analysis of poly-crystalline materials Benchtop X-ray diffractometer for phase analysis New sixth generation MiniFlex benchtop X-ray diffractometer is a multipurpose powder diffraction analytical instrument that can determine: crystalline phase identification (phase ID) and quantification, percent (%) crystallinity, crystallite size and
MULTIPURPOSE X-RAY DIFFRACTION SYSTEM WITH BUILT-IN INTELLIGENT GUIDANCE Powder diffraction, thin film diffraction, SAXS, pole figure, residual stress and non-ambient experiments The SmartLab® SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original
High-resolution micro-CT for sub-micron imaging and dynamic 4D in-situ testing Tescan UniTOM HR gives you sub-600 nm spatial resolution and high-speed, time-resolved 3D imaging in a single system. Visualize structural evolution under load, temperature, or environmental conditions in real time across a wide range of sample sizes. Key benefits High-fidelity
X-ray computed tomography (CT) X-ray CT can analyze the internal structures of materials and objects non-destructively at micron to submicron resolution. Rigaku’s CT scanners are easy to use and widely implemented in research facilities and failure analysis laboratories.
Tescan VEGA compact Compact analytical SEM for fast, high-quality imaging and EDS in materials science, QA/QC, and education. Tescan VEGA Compact delivers high-resolution imaging and integrated EDS in a simplified, space-efficient system. With intuitive Tescan Essence™ software and a large chamber that accommodates industrial-scale samples, it’s the ideal choice for
TUBE-ABOVE SIMULTANEOUS WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER High-throughput elemental analysis of solids, powders and alloys For over 40 years, the Rigaku Simultix simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system has been widely used as an elemental analytical tool for process control in industries that require high throughput and precision,
TUBE-ABOVE SEQUENTIAL WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER Elemental analysis of solids, liquids, powders, alloys and thin films As a tube-above sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in
BENCHTOP POWDER X-RAY DIFFRACTION (XRD) INSTRUMENT Qualitative and quantitative phase analysis of poly-crystalline materials Benchtop X-ray diffractometer for phase analysis New sixth generation MiniFlex benchtop X-ray diffractometer is a multipurpose powder diffraction analytical instrument that can determine: crystalline phase identification (phase ID) and quantification, percent (%) crystallinity, crystallite size and
MULTIPURPOSE X-RAY DIFFRACTION SYSTEM WITH BUILT-IN INTELLIGENT GUIDANCE Powder diffraction, thin film diffraction, SAXS, pole figure, residual stress and non-ambient experiments The SmartLab® SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original
High-resolution micro-CT for sub-micron imaging and dynamic 4D in-situ testing Tescan UniTOM HR gives you sub-600 nm spatial resolution and high-speed, time-resolved 3D imaging in a single system. Visualize structural evolution under load, temperature, or environmental conditions in real time across a wide range of sample sizes. Key benefits High-fidelity
X-ray computed tomography (CT) X-ray CT can analyze the internal structures of materials and objects non-destructively at micron to submicron resolution. Rigaku’s CT scanners are easy to use and widely implemented in research facilities and failure analysis laboratories.
Tescan VEGA compact Compact analytical SEM for fast, high-quality imaging and EDS in materials science, QA/QC, and education. Tescan VEGA Compact delivers high-resolution imaging and integrated EDS in a simplified, space-efficient system. With intuitive Tescan Essence™ software and a large chamber that accommodates industrial-scale samples, it’s the ideal choice for
TUBE-ABOVE SIMULTANEOUS WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER High-throughput elemental analysis of solids, powders and alloys For over 40 years, the Rigaku Simultix simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system has been widely used as an elemental analytical tool for process control in industries that require high throughput and precision,
TUBE-ABOVE SEQUENTIAL WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER Elemental analysis of solids, liquids, powders, alloys and thin films As a tube-above sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a
BENCHTOP POWDER X-RAY DIFFRACTION (XRD) INSTRUMENT Qualitative and quantitative phase analysis of poly-crystalline materials Benchtop X-ray diffractometer for phase analysis New sixth generation MiniFlex benchtop X-ray diffractometer is a multipurpose powder diffraction analytical instrument that can determine: crystalline phase identification (phase ID) and quantification, percent (%) crystallinity, crystallite size and