Compact analytical SEM for fast, high-quality imaging and EDS in materials science, QA/QC, and education.
Tescan VEGA Compact delivers high-resolution imaging and integrated EDS in a simplified, space-efficient system. With intuitive Tescan Essence™ software and a large chamber that accommodates industrial-scale samples, it’s the ideal choice for reliable, everyday materials analysis—today and in the future.
Key benefits
- Analyze large or multiple samples faster with a spacious chamber and true high vacuum for dependable EDS results.
- Quickly set optimal beam conditions with Tescan’s In-Flight Beam Tracing™.
- Correlate morphology and composition instantly using Essence™ EDS overlay tools in one intuitive interface.







