Ultra-High-Resolution SEM That Reveals More Information from Every Scan
Extract more information from challenging materials at low landing energies. CLARA™ combines field‑free ultra‑high‑resolution SEM imaging, advanced secondary electron (SE) and backscattered electron (BSE) detection, and guided automation to help you move from sample navigation to confident insight faster.
Designed for nanoscale characterization across diverse materials and workflows, CLARA™ enables you to reveal fine surface structures, material differences, and near-surface features from a single acquisition while maintaining the flexibility required for advanced analytical techniques.
CLARA™ gives researchers the resolution, contrast control, and guided operation needed to explore surface detail, material differences, and near‑surface features with confidence.
Built on Tescan’s BrightBeam™ field-free SEM column technology and operated through Tescan’s Essence™ software, CLARA™ supports efficient work across diverse samples, shared instruments, and mixed experience levels. It helps you capture meaningful information with less compromise, less setup, and fewer repeated measurements.
- True ultra-high-resolution field-free imaging at low keV
Delivers stable nanoscale detail across different samples, including charging, sensitive, and magnetic samples.
- Simultaneous UHR SE and BSE imaging with advanced contrast control
Combines parallel acquisition of SE and BSE signals with energy-filtered and angle-selective BSE contrast for deeper material insight in a single scan.
- Effortless switching between imaging conditions and seamless navigation
Powered by In-Flight Beam Tracing® automation for rapid beam optimization, combined with Wide Field Optics® for seamless navigation from macro to nano.
- Advanced analytical workflows with open platform flexibility
Supports integration of multiple analytical modalities (EDS, EBSD, Raman, etc.) and customizable workflows via custom automation and Python-based scripting.
- MultiVac low-vacuum imaging with water vapor and easy switching
Improves signal quality and enables stable imaging and analysis of charging and beam-sensitive samples with an uncompromised view field.
Where Tescan CLARA™Makes the Difference
Modern nanoscale characterization requires more than resolution alone.
CLARA™ is designed to help researchers extract multiple complementary contrasts from the same region of interest, revealing information that conventional imaging workflows can miss.
Through simultaneous ultra-high-resolution secondary electron (SE) and backscattered electron (BSE) imaging, combined with energy-filtered and angle-selective BSE detection, CLARA™ enables researchers to:
- Reveal fine surface topography
- Differentiate material phases and composition
- Detect near-surface contamination and buried structures
- Visualize orientation-sensitive features
- Reduce rescans and repeated measurements
- Move more quickly from imaging to interpretation
Unlike conventional UHR SEM workflows that require repeated acquisitions or detector switching, CLARA™ combines multiple complementary signals within a single platform and workflow.
True Multimodal Contrast at the Nanoscale
The redesigned MultiDetector™ and Axial detector enable flexible contrast selection for both surface-sensitive and material-sensitive imaging.
Energy-filtered BSE imaging helps reveal near-surface material differences and contamination that may remain hidden in conventional BSE workflows. Angular contrast selection further enhances the interpretation of topographic and compositional variation.
The result is richer nanoscale characterization from every acquisition.
- Ultra-High-Resolution Imaging at Low Landing Energies
- Simultaneous UHR SE and BSE Imaging
- Faster Time-to-Data with Automation
- Built for Shared Research Laboratories
- Advanced Analytical Workflows
- Tescan Imaging Software
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