UHR SEM with TriLens™ immersion optics for the ultimate characterization of nanomaterials
Tescan MAGNA™ is designed for high-performance surface characterization of nanomaterials. Its Triglav™ SEM column delivers ultra-high-resolution imaging, particularly at low beam energies, and the integrated In-Beam detection system enables energy-filtered and angle-resolved backscattered electron contrast.
The Tescan Essence™ interface offers a customizable, intuitive environment with dedicated modules for streamlined operation.
- Ultra-high resolution and high-contrast imaging of next-gen materials
- Unique TriBE™ and TriSE™ detection for advanced nano characterization
- Optimal imaging and analytical conditions guaranteed by Tescan In-Flight Beam Tracing™
Where Tescan MAGNA™makes the difference
Sub-nanometer Resolution Across All Voltages
The Triglav™ SEM column delivers crisp, ultra-high-resolution imaging down to 0.5nm at 30 keV, ensuring accurate visualization of even the finest nanostructures.
Flexible SEM and STEM Imaging in One Platform
Observe surface topography and internal features with SEM and STEM, enabling comprehensive characterization of nanoparticles, nanotubes, and porous frameworks.
High-Contrast Detection for Complex Materials
The TriSE and TriBSE detection system provides selective energy and angular filtering, revealing structural and compositional details in black silicon, catalytic materials, and other challenging samples.
Effortless Imaging Setup and Switching
With In-Flight Beam Tracing™ and automated beam alignment, researchers can rapidly establish optimal conditions and transition between imaging and analytical modes without workflow interruptions.
Safe, Multi-User SEM Operation
Essence™ software with a live 3D collision model ensures straightforward operation, making MAGNA™ safe to operate instrument.
Automation and Scripting for Advanced Workflows
Use VisualCoder SEM automation or the SEM Expert PI to standardize workflows, automate repetitive tasks, and or prototype new experiments.
