Tescan TENSOR™

Tescan TENSOR™

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Product Details

Novel Automated Platform for Analytical STEM and 4D-STEM Characterization 

Tescan TENSOR™ delivers fast, multimodal characterization of nanoscale morphological, chemical, and structural properties. It uses STEM imaging, EDS analysis, and advanced 4D-STEM as well as 3D-ED and STEM/EDS tomography workflows.

Fully integrated beam precession provides enhanced quality of diffraction data, resulting in higher accuracy and precision of strain analysis and phase-orientation mapping measurements.

The TENSOR™ cryo-EM solution extends these capabilities to cryo-STEM, cryo-EDS, cryo-3D ED, and cryo-4D STEM analysis of beam-sensitive materials by combining a cryo-transfer holder with low-dose procedures in Tescan Explore™ software.

From room-temperature analysis to cryogenic workflows, TENSOR™ helps you make confident decisions with data you can trust.

  • Characterize samples by multiple modalities using BF/DF STEM imaging, EDS analysis, 3D STEM/EDS tomography, and advanced 4D-STEM and/or 3D-ED workflows.
  • Increase yield and reproducibility with automatic microscope alignments that are done in the background with no user intervention.
  • Boost productivity with high-speed, high-sensitivity detectors that maintain fast acquisition across all modalities.
  • Speed up 4D-STEM workflows with fast beam precession and on-the-fly data processing and analysis.
  • Improve diffraction data quality through fully integrated and synchronized beam precession.
  • Minimize sample contamination to preserve data quality in the near-UHV vacuum environment of the microscope.
  • Support users at every experience level with automation and guided workflows that assure optimal conditions for data acquisition.
How TENSOR™
Accelerates Productivity and Scientific Output

Navigate Samples Easily with the Specimen Overview Map

Begin every session with a clear view of your specimen. The overview map helps you locate regions of interest quickly and intuitively, so you can move across complex samples with confidence.

Work Seamlessly with Automatic Background Alignments

Maintain stable microscope conditions at all analytical modes without interruption. TENSOR™ performs alignments in the background, allowing you to focus on your analysis rather than manual setup.

Enhance Diffraction Data with One-Click Beam Precession

Improve diffraction pattern quality instantly. Beam precession is fully integrated and activated in a single click, including very robust automatic alignments, giving you cleaner, richer, and more interpretable data.

Streamline Experiments with Guided Measurement Workflows

Use predefined optical settings, automated alignments, and simple parameter controls to keep your workflow consistent. On-the-fly processing and analysis help you reach results faster.

Increase Throughput with High-Speed Acquisition

Collect data up to ten times faster and shorten your time to multimodal results by a factor of four. TENSOR™ helps you progress through demanding studies without delay.

Train New Users Quickly with Sample-Analysis Oriented Workflows

Support new researchers with intuitive and sample-analysis oriented workflows with microscope setting presets, while microscope alignments and tuning are done automatically in the background. TENSOR™ reduces the learning curve so your team can become productive much sooner.

Tescan TENSOR™ Cryo-EM Solution

Low-Dose Cryo Analysis for Beam-Sensitive Materials

The Tescan TENSOR™ cryo-EM solution extends TENSOR™’s multimodal analytical capabilities to cryogenic analysis of beam-sensitive materials, enabling cryo-STEM, cryo-EDS, cryo-4D-STEM, and cryo-3D ED workflows. By combining a cryo-transfer holder with low-dose procedures in Tescan Explore™ software, it helps preserve sample integrity and supports advanced characterization of materials that are difficult to analyze under room-temperature conditions.

  • Protect the region of interest before acquisition with software-guided low-dose procedures 
  • Characterize a wide range of beam-sensitive samples, including soft materials, polymers, MOFs/COFs, organic compounds, functional materials, liposomes, and protein complexes 
  • Perform Long-Duration Cryo Analysis with Minimal Ice Contamination

 

DUT-67 half-structure

TESCAN TENSOR™ APPLICATIONS

 

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