Tescan VEGA™ Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and elemental composition analysis in a single window of Tescan’s Essence™ software. This significantly simplifies acquisition of both morphological and elemental data from the sample, making VEGA™ SEM an efficient analytical solution for routine materials inspection in quality control, failure analysis and research labs.
With intuitive navigation, dependable beam performance, and flexible detector options, VEGA™ provides reliable, user-friendly SEM for routine analytical work.
- Navigate large or complex samples effectively with Wide Field Optics™ providing a clear SEM overview at low magnification
- Correlate morphology and elemental composition with integrated Essence™ EDS.
- Maintain optimal imaging conditions automatically with In-Flight Beam Tracing™
- Image non-conductive or beam-sensitive samples using SingleVac™ or MultiVac with gaseous SE detection
- Protect detectors and samples with the Essence™ 3D Collision Model
Navigate Samples Easily with Wide Field Optics™
Begin with a clear SEM overview at magnifications as low as 2×. Wide Field Optics™ supports fast, confident movement across large, complex, or tilted samples without switching to an optical camera.
Image Non-Conductive or Sensitive Samples with Low Vacuum modes Modes
Use SingleVac™ for quick charge reduction or MultiVac with gaseous SE detection to capture detailed topography on uncoated, beam-sensitive, or outgassing materials.
Achieve Reliable Imaging and Analysis with In-Flight Beam Tracing™
Maintain optimal imaging and analytical conditions automatically and switch between them with a single click. No need for mechanical adjustments.
Protect Hardware with the Essence™ 3D Collision Model
Move with confidence during stage rotations or tilt. VEGA™’s real-time 3D collision simulation models detectors, samples, and chamber geometry to prevent unwanted contact.
Analyze Composition Rapidly with Integrated Essence™ EDS
Correlate morphology and elemental data in the same live SEM window. Essence™ EDS streamlines setup and provides instant access to spectra, maps, and profiles.
Expand Analytical Capability with Modular Detector Options
Adapt workflows with optional BSE detectors, CL, ONCam™ optical navigation or other detectors. VEGA™ supports scalable analytical configurations for evolving laboratory needs.
TESCAN IMAGING SOFTWARE
Tescan ESSENCE™
Unified Control for Imaging and Analysis
Tescan Essence™ is the graphical user interface for Tescan VEGA™, bringing SEM imaging, EDS analysis, navigation, and system protection tools into a single interface. It keeps routine workflows efficient and consistent, whether used in materials research, industrial inspection, or multi-user facilities.
- Access spectra, elemental maps, and imaging data within a single integrated Essence™ SW control interface
- Maintain consistent beam performance with In-Flight Beam Tracing™
- Navigate confidently using the real-time Essence™ 3D Collision Model to protect detectors and samples
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TESCAN VEGA™ APPLICATIONS
- Tescan VEGA™ in Materials Science
- Tescan VEGA™ in Nanoprototyping
- Tescan VEGA™ in Geoscience
- Tescan VEGA™ in Industrial Inspection & Quality Control
- Tescan VEGA™ in Research & Multi-User Facilities
