Tube-above simultaneous wavelength dispersive X-ray fluorescence spectrometer
High-throughput elemental analysis of solids, powders, and alloys
The compact and intelligent Simultix 15 is a powerful analytical tool for elemental analysis that demonstrates superior performance across many industrial sectors.
Simultix15 Overview
For over 40 years, the Rigaku Simultix simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system has been widely used as an elemental analytical tool for process control in industries that require high throughput and precision, such as steel and cement. Nearly 1,000 Simultix XRF instruments have been delivered to customers around the world. Along with technological progress over these years, customer requirements have advanced and diversified as well. Simultix 15 WDXRF elemental analyzer was developed to meet these changing needs. It offers significantly improved performance, functions, and usability.
XRF for fast, precise elemental analysis
Analyze beryllium (Be) through uranium (U) in almost any sample matrix. The most important metrics for automated process control are precision, accuracy and sample throughput. With up to 30 (and optionally 40) discrete and optimized elemental channels and 4 kW (or optionally 3 kW) of X-ray tube power, Simultix 15 delivers unparalleled analytical speed and sensitivity. Coupled to powerful but easy-to-use software, with extensive data reduction capabilities and maintenance functionality, this instrument is the perfect elemental analysis metrology tool.
Elemental analysis by XRF with full automation
For high-throughput applications, automation is a fundamental requirement. Rigaku Simultix 15 WDXRF spectrometer may be fitted with a 48-position Automatic Sample Changer (ASC). For full automation, the optional Sample Loading Unit provides right or left side belt-in feed from a third party sample preparation automation system.
Elemental analysis by simultaneous WDXRF
In contrast to the more common sequential WDXRF instrumentation, where elements are measured one after the other using a scanning goniometer equipped with an analyzing crystal changer mechanism, simultaneous WDXRF speeds up the measurement process. Each Rigaku Simultix 15 XRF spectrometer is customized for your specific elemental analysis applications with a set of discrete, optimized fixed channels for the elements of interest. All channels measure simultaneously—without moving parts, without time delay and without compromise. This makes simultaneous WDXRF the best solution in terms of time-to-result, precision, reliability, low cost-per-analysis and instrument longevity. For additional flexibility, Simultix 15 wavelength dispersive X-ray fluorescence spectrometer may be optionally equipped with a scanning goniometer for analysis of other elements as well as XRD channels for phase analysis.
Simultix15 Features
- RX Series synthetic multi-layers New synthetic multi-layer crystal ”RX85” produces about 30% greater intensity than existing multi-layers for Be-Ka and B-Ka.
- XRD channel Equipped with an XRD channel, Simultix 15 can perform quantitative analysis by XRF and XRD.
- Doubly curved crystal An optional doubly curved crystal can be added to a fixed channel. This increases the intensity compared to a single curved crystal.
- Improved easy-to-use software Simultix 15 software has enhanced operability of quantitative condition setting by adopting a quantitative analysis flow bar like the one found in the ZSX software.
- Heavy and light scanning goniometer Optional wide elemental range goniometer supports standardless semi-quant (FP), and may be used for qualitative or quantitative determination of non-routine element.
- BG measurement for trace elements Optional background measurement (BG) for fixed channel, resulting in improved calibration fits and superior accuracy.
- Automatic Pressure Control (APC) Optional APC system maintains a constant vacuum level in the optical chamber to dramatically improve light element analysis precision.
- Quantitative scatter ratio method When utilizing the Compton scattering ratio method, for ore and concentrate analysis, optional quantitative scatter ratio method generates theoretical alphas for scattering ratio calibration.
- Up to 40 fixed channels Standard 30 fixed channel configuration may be optionally upgraded to 40 channels.
- Automation Optional Sample Loading Unit provides belt-in feed from a third party sample preparation automation system.
Simultix15 Specifications
| Technique | Wavelength dispersive X-ray fluorescence (WDXRF) | |
|---|---|---|
| Benefit | High-throughput elemental analysis of solids, powders and alloys | |
| Technology | Tube above simultaneous WDXRF | |
| Attributes | 3 or 4 kW sealed X-ray tube, 8-position autosampler, Be to U, vacuum | |
| Options | Additional channels XRD channel Scanning goniometer |
|
| Computer | External PC, MS Windows OS, Simultix software | |
| Dimensions | 1310 (W) x 1470 (H) x 890 (D) mm | |
| Mass | Approx. 700 kg (core unit) | |
| Power requirements | 1Ø, 200 VAC 50/60 Hz, 40 A | |